AFM stands for atomic force microscope. Gerd Binnig, Calvin Quate and Christoph Gerber invented the first atomic force microscope in 1986. It is a type of high-resolution scanning probe microscope that has a resolution that you can measure in a fraction of a nanometer.
The AFM ‘feels’ the atoms rather than ‘sees’ them. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the Nano scales. It is very versatile, and this versatility has led to an explosion in the number of scientists using the instrument.
Eric Drexler is often described as ” the founding father of nanotechnology ”. He was the first to publish a technical paper, and book on molecular nanotechnology. For this reason, he is also called Mr. Nano.